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汽车电子芯片EMC测试标准研究 被引量：3

Research on EMC Test Standards for Automotive Electronic Chips
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摘要 在汽车电子产品所采用的电磁兼容测试标准的基础上,以功率驱动芯片为例,提出了汽车电子芯片级电磁兼容测试的必要性,并重点介绍了集成电路电磁发射测试标准IEC61967和集成电路电磁抗扰度测试标准IEC62132。 On the basis of the existing test standards of electromagnetic compatibility （EMC） for automotive electronics, taking power MOSFET driver chip as an example, this paper describes the necessity of EMC test especially for chips used in automotive electron- ics. And furthermore, focuses on the test standards IEC 61967 and IEC 62132 for integrated circuits＇ electromagnetic emission testing and electromagnetic immunity testing.
作者 严伟 熊胜江 陈楚
机构地区 北京大学上海微电子研究院 北京大学软件和微电子学院
出处 《安全与电磁兼容》 2012年第2期43-45,共3页 Safety & EMC
关键词 汽车电子 芯片 EMC 测试标准 automotive electronics chips EMC test standard
分类号 U463.6 [机械工程—车辆工程]
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  • 1米切尔·麦迪奎安.电磁干扰排查及故障解决的电磁兼容技术[M].北京:机械工业出版社,2002.
  • 2[1]VIOLETTE J L N, et al. Electromagnetic compatibility handbook[M]. New York: Van Nostrand Reinhold Company,1997.
  • 3[2]ROBINSON M P, FISCHER K, FLINTOFT I D, et al.A simple model of EMI-Induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance[J]. IEEE Trans on Electromagnetic Compatibility, 2003,45(3):513-519.
  • 4[3]WESTON D A. Electromagnetic Compatibility[M].Marcel Dekker Inc, 2000.342-353.
  • 5[4]WU T L, CHEN S T, HUANG J N, et al. Numerical and experimental investigation of radiation caused by the switching noise on the partitioned dc reference planes of high speed digital PCB[J].IEEE Trans on Electromagnetic Compatibility, 2004,46(1):33-45.
  • 6[5]IEC 61967-1-2001.Integrated Circuits -Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 1: General conditions and definitions.47A/632/FDIS[S]..
  • 7[6]IEC 62132-1-2001.Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1GHz Part 1: General and definitions.47A/618/CD[S]..
  • 8[7]IEC 61967-2 .Integrated Circuits -Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz - Part 2:Mesurement of Radiated Emissions, TEM-cell method(150kHz to 8 GHz) .47A/619/NP1[S].
  • 9[8]KA.ST J P, GROH C; GARBE H. Calculable field generation using TEM cells applied to the calibration of a novel E-field probe[J]. IEEE trans on Electromagnetic Compatibility, 2002, 44(1):59.
  • 10[9]IEC 61967-4-2002.01-18.Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz -Part 4:Measurement of Conducted Emissions 1/ 150 Direct Coupling Method.47A/636/FDIS[S].

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安全与电磁兼容
2012年 第2期

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