摘要
介绍了两种受激布里渊散射相位共轭组束的方法及研究现状 ,并指出其未来发展前景。
Two methods and present research situation of beam combination by stimulated Brillouin scattering are introanced and its development prospect is pointed out. Key words stimulated Brillouin scattering, phase conjugation, beam combination, beam combination efficiency, piston error, beam qualityts from a complex scene. Once isolated, the extra material defect boundary can be examined by using morphology operators. The group size features (those are area, perimeter, object core, width and length) and the shape feature (those are called rectangularity and circularity measures) are detected from the boundary image. Experimental result shows that proposed methods make the shape analyzing of IC extra material defects simple and detectable.
出处
《激光与光电子学进展》
CSCD
2000年第5期7-12,共6页
Laser & Optoelectronics Progress
基金
国家自然科学基金资助!(项目编号 6 97880 0 6 )
关键词
受激布里渊散射
相位共轭
组束
IC defect color image, boundary extraction, size measurement, shape analyzing, morphology operators