摘要
从生产角度分析了彩色滤光片中液晶间隔柱制造过程中遇到的显影液残留缺陷,通过EDS分析、机台比对等多种手法,明确确定了不良缺陷发生的原因,并通过多组实验方法的对比结果,找出了控制显影液残留的最佳方法。
According to mass production, the PS Remains Defect in CF Process has been analyzed. By EDS analysis, machine comparison and other techniques, the causes of PS Remains Defect has been studied. Then through multi-group comparison of the results of experimental methods, we find the best way to control the PS Remains Defect.
出处
《现代显示》
2012年第3期21-25,共5页
Advanced Display
