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基于概率模型的QCA触发器可靠性研究 被引量：1

The Reliability Study of QCA Flip-flop Based on Probability Model
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摘要 通过将时序逻辑电路中的反馈回路打开,在原有电路结构的基础上增加一路输入,采用概率转移矩阵方法建立了基于QCA的RS触发器、D触发器、JK触发器的可靠性模型,深入研究了各组成元件对其可靠性影响的差异,从而为其可靠性的提高提供了依据,这对于高缺陷率的QCA电路的可靠性设计具有重要的指导意义。 The reliability of the sequential circuit based on QCA, e.g. RS flip-flop, D flip-flop, JK flip-flop is studied through opening up the feedback loop and adding one input on the ba-sis of the former circuit structure. The reliability model is based on the probabilistic transfer ma-trix. And the effect of individual component on the overall reliability is deeply analyzed. Thestudy provides the proof for the improvement of the QCA circuit. And it is important for the reli-ability design for the high defect-rate QCA circuit.
作者 黄宏图 蔡理 杨晓阔 李政操
机构地区 空军工程大学理学院
出处 《固体电子学研究与进展》 CAS CSCD 北大核心 2012年第2期126-130,共5页 Research & Progress of SSE
基金 国家自然科学基金资助项目((61172043) 陕西省自然科学基础研究计划重点基金资助项目(2011Jz015)
关键词 量子元胞自动机 时序逻辑电路 触发器 概率转移矩阵 可靠性 元胞缺陷 quantum-dot cellular automata sequential circuit flip-flop probabilistic trans-fer matrix reliability cellular defects
分类号 TN406 [电子电信—微电子学与固体电子学]
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参考文献9

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同被引文献29

  • 1NAVI K,FARAZKISH R,SAYEDSALEHI S,et al.A new quantum-dot cellular automata full-adder[J].Microelectronics Journal,2010,41(12):820-826.
  • 2SAKET S,BHANJA S.Hierarchical probabilistic macromodeling for QCA circuits[J].IEEE Transactions on Computers,2007,56(2):174-190.
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  • 4TANG Y.Experimental demonstration of radio frequency quantum-dot cellular automata devices[D].Indiana:University of Notre Dame,2009.
  • 5DYSART T J,KOGGE P M,LENT C S,et al.An analysis of missing cell defects in quantum-dot cellular automata[C]//Proceedings of the IEEE International Workshop on Design and Test of Defect-tolerant Nanoscale Architectures.Palm Springs,CA,USA,2005:1-7.
  • 6TAHOORI M B,MOMENZADEH M,HUANG J,et al.Defects and fault characterization in quantum cellular automata[C]//Proceedings of the IEEE Conference on Nanotechnology.Munich,Germany,2004:190-193.
  • 7MA X J,HUANG J,METRA C.Detecting multiple faults in one-dimensional arrays of reversible QCA gates[J].Journal of Electronic Testing,2009,25,(1):39-54.
  • 8MOMENZADEH M,HUANG J,TAHOORI M B,et al.On the evaluation of scaling of QCA devices in the presence of defects at manufacturing[J].IEEE Transactions on Nanotechnology,2005,4(6):740-743.
  • 9TAHOORI M B,HUANG J,MOMENZADEH M,et al.Testing of quantum cellular automata[J].IEEE Transactions on Nanotechnology,2004,3(4):432-442.
  • 10DAI J W,WANG L,JAIN F.A quantitative approach for analysis of defect tolerance in QCA[C]//Proceedings of the8th IEEE Conference on Nanotechnology.Arlington,USA,2008:903-906.

引证文献1

二级引证文献1

固体电子学研究与进展
2012年 第2期

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