基于多信号模型的测试性分析方法研究

Research on Testability Analysis Method Based on Multi-signal Model

多信号模型是一种简单而有效的建模表示方法,用于系统测试性分析、故障诊断等;在产品结构的基础上以分层有向图表示信号流向和各组成单元的连接关系,通过定义组成单元、信号、故障模式、测试等建立多信号模型,获取故障与测试之间的相关性来实现对产品的测试性分析;结合示例介绍了多信号模型的表示方法,给出故障-测试依存矩阵以及未检测故障、模糊组、冗余测试、隐藏故障、冒充故障、故障检测率和故障隔离率的具体分析过程和算法;算法分析结果与应用TADS软件分析结果相一致。

Multi--signal model is a simple but efficient knowledge representation method which is used for testability analysis and fault diagnosis. On the basis of the product structure, it is a hierarchical directed graph that indicates the direction of signals, the component of in dividual unit and the mutual relationship, and it is used to implement testability analysis by obtaining the fault--test dependency matrix. The multi--signal model of the product can be represented by defining its modules, signals, faults, tests, etc. We combine a illustration to show the analysis process and algorithm of fault--test dependency matrix, undetected faults, ambiguity groups, redundant tests, hidden failures, masking false failures, FDR and FIR. The result of the above algorithm is the same as the one of TADS.