摘要
超大规模集成电路和组装工艺快速发展,电路板结构和功能日趋复杂,将边界扫描技术应用于系统级测试,对提高系统的可靠性和可维护性具有重要的实用意义;在深入研究IEEE1149.5和IEEE1149.1标准的基础上,对基于MTM总线的边界扫描控制器结构进行了研究,解决了IEEE1149.5与IEEE1149.1协议转换中的关键技术,设计实现了内嵌边界扫描功能的MTM总线从模块,使用SpartanⅡ器件实现了基于MTM总线的边界扫描控制器;仿真和实验结果表明,IEEE1149.5总线接口、IEEE1149.1端口和TAP控制器功能正确,符合系统层次化测试的实际要求。
With the development of VLSI and assembly technique, the construction and function of printed board become more complex, and system level test become more and more difficult. It is importance to apply boundary--scan technology to system--level test to improve the reliability and maintainability of system. With intensive study on IEEE std 1149. 5 and IEEE std 1149.1, the boundary--scan controller construction based on MTM--bus is explored according to functional requirement of hierarchical system test. The problem of conversion be- tween IEEE std 1149. 5 and IEEE std 1149.1 is solved and a boundary--scan controller embedded in slave module is developed. The design is based on Spartan 11 FPGA. Simulation and practical tests show that the function of MTM--bus , boundary--scan port and TAP controller is correct, which meets the requirement of hierarchical system test.
出处
《计算机测量与控制》
CSCD
北大核心
2012年第4期929-932,共4页
Computer Measurement &Control
基金
国家863计划资助项目(2006AA04A106)