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SR-XRD和EXAFS研究Mn掺杂ZnO薄膜的微观结构 被引量:3

SR-XRD and EXAFS study on microstructure of Mn doped ZnO films
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摘要 用射频磁控溅射技术在蓝宝石衬底上制备了一组不同衬底温度的Mn掺杂ZnO薄膜。质子激发X射线荧光(PIXE)测量表明,薄膜中仅有含量为5 at.%的Mn,未见其它磁性杂质元素(如Fe、Co、Ni等)。同步辐射X射线衍射(SR-XRD)表明,这些Mn掺杂ZnO薄膜具有纤锌矿ZnO结构。SR-XRD和扩展X射线吸收精细结构谱(EXAFS)分析显示,薄膜中未发现Mn团簇或MnO、MnO2、Mn2O3、Mn3O4等二次相,Mn原子是通过替代Zn原子而进入了ZnO晶格。 Mn-doped ZnO films were prepared by radio frequency magnetron sputtering on sapphire substrate at different temperatures.They contained Mn of 5 at.%,without any magnetic impurities of Fe,Co and Ni,as were revealed by proton induced X-ray emission(PIXE).Synchrotron radiation X-ray diffraction(SR-XRD) showed that the ZnO:Mn films possessed the wurtzite ZnO structure.No precipitates such as Mn cluster or MnO,MnO2,Mn2O3,and Mn3O4were observed by SR-XRD and fluorescence extended X-ray absorption fine structure spectra(EXAFS) in ZnO:Mn films.EXAFS analysis also showed that Mn atoms were incorporated into ZnO crystal lattice by occupying the sites of zinc atoms.
出处 《核技术》 CAS CSCD 北大核心 2012年第5期321-325,共5页 Nuclear Techniques
基金 国家自然科学基金(10775033 11075038) 上海市重点学科建设项目资助(B107)
关键词 同步辐射X射线衍射 扩展X射线吸收精细结构谱 Mn掺杂ZnO薄膜 微观结构 SR-XRD EXAFS Mn-doped ZnO film Microstructure
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