摘要
用扫描电镜(SEM)、涡流电导率测量仪和万能试验机分别对经冷变形后在400～500℃不同时间时效条件下Cu-2.1Ni-0.5Si-0.2Zr合金抗拉强度及电导率性能进行测量,用光学显微镜(OM)、扫描电子显微镜(SEM)观察了合金时效下的组织.结果表明:时效初期合金的抗拉强度及电导率增加较快,随着时效时间的延长,其抗拉强度达到峰值而电导率继续增加.合金在450℃时效2 h,其抗拉强度达到峰值,其值为665 MPa.合金中主要析出相为Ni2Si和CuxZr.利用Mott-Nabarro和Orowan公式对合金强化机理进行了分析.
A series of experiments were performed on the effects of different aging temperature and time in the range between 400~500 ℃ on the micro-morphology,physical properties,mechanical properties and strengthening mechanism of the Cu-2.1Ni-0.5Si-0.2Zr alloy,by using Microscope,SEM,eddy electrical conductivity tester,and universal materials testing machine.The results show the strength and electrical conductivity rapidly increased at early stages of aging.Then,the hardness decreased slowly after reaching peak value,while the conductivity continued to rise.The highest peak strength value of 665 MPa for the alloy aged at 450 ℃ for 2 h.There are two main types of precipitate spreads in the matrix of this alloy,Ni2Si phase and CuxZr phase.The formulas of Mott-Nabarro and Orowan can be used to explain the precipitation strengthening.
出处
《有色金属科学与工程》
CAS
2012年第2期12-16,共5页
Nonferrous Metals Science and Engineering
基金
国家高技术研究发展计划(863计划)项目(2006AA03Z522)
