X射线衍射强度公式的修正

The Modified of the X-Ray Diffraction Intensity Formula

X射线衍射技术在物相分析、点阵参数测量以及微应力的测定等方面被广泛应用,为了更精确地确定物理参数,X射线衍射强度的精确计算是十分重要的.目前单晶X射线衍射的强度公式的理论计算结果与实验数据有较大偏差.对衍射强度公式进行合理修正,使计算结果得到较大改善,并与实验测量的数据符合得更好.

The X-ray diffraction technology has been widely applied in phase identification,the determination of lattice parameters and the testing of the microstress.In order to precisely determine the physical parameters,the calculation of the X-ray diffraction intensity is very important.At present,comparedg with the experimental data,the theoretical results of the X-ray diffraction intensity formula have a large deviation.In this paper,the X-ray diffraction intensity formula has been modified reasonably and the improved results of the theoretical are in good accordance with the experimental data.