电荷耦合器件在电子束参数测量中的损伤问题

Damage problem of CCD in the electron beam parameters measure

针对直线感应电子加速器(LIA)实验束参数测量技术应用过程中,电荷耦合器件(CCD)在纳秒激光辐照下工作的损伤效应方面进行研究。在分析CCD感光成像原理及其高能粒子测量应用的基础上,通过监测这种辐射下CCD输出信号的变化和实验后CCD的成像,对CCD中发生的软、硬损伤进行探讨,得到CCD能量损伤阈值的光子的响应特性和辐射损伤评估,保证了加速器束参数测量的可靠性。

There are strong electromagnetism interruption in the process of high power electron beam parameters measure and diagnosis.The Charge Coupled Devices（CCD） is irradiated by strong electron pulse,laser and X-ray.According to the analysis on the CCD imaging principle and the measure on high energy particles,the changes of the CCD output signals under the radiation environment are monitored as well as the CCD imaging after the experiment.The soft-damage and hard-damage of CCD are discussed.It is found that the damage occurs at the grid electrode of the device instead of at the light activated elements.The response characteristics of beam whose energy reaches the damage threshold are obtained.The evaluation on radiation damage is given,which ensures the reliability of beam parameters measure of accelerator.