电感耦合等离子体发射光谱在分析废液晶显示器面板主要元素中的应用

Analyzing the main elements in waste TFT-LCD panel by using inductively coupled plasma atomic emission spectrometry

采用电感耦合等离子体发射光谱(ICP-AES)法对废液晶显示器(TFT-LCD)面板主要元素含量进行了测定。结果表明:(1)在酸体系下回收废TFT-LCD面板中In时,尽管不同酸体系下各元素浓度变化较大,但是主要伴随元素以Al、Fe为主。(2)绝大多数元素测定结果的相对标准偏差低于3%。(3)不同元素加标回收率基本在86%～110%。ICP-AES法具有灵敏度高、检出限较低、多元素同时测定等优点,能满足元素测定误差要求,可有效应用于废TFT-LCD面板中主要元素的测定。

The inductively coupled plasma atomic emission spectrometry（ICP-AES） was employed for the determination of main elements in waste TFT-LCD panels.The recovery of In from waste TFT-LCD was performed in acid system,despite the recovery element vary significantly under different acid system,the main companied elements were always Al and Fe.The relative standard deviation for most elements was less than 3% and the recovery rate of standards was ranged 86%-110%.ICP-AES had the advantages of high sensitivity,low detection limit and simultaneous multielement detection;it could satisfy the requirements for elements measuring and could be effectively applied in the determination of main elements in waste TFT-LCD panel.