期刊文献+

Nb/A1-AlO_X/Nb隧道结的制备研究 被引量:2

Fabrication on Nb/A1-AlO_X/Nb tunnel junction
下载PDF
导出
摘要 通过改进RIE的刻蚀工艺和绝缘层的生长工艺,在SiO2/Si衬底上制备出了性能良好的超导Nb/A1-AlOX/Nb隧道结。采用CF4作为刻蚀气体,降低了RIE对结势垒层和衬底SiO2层的刻蚀。使用PECVD生长绝缘层SiO2,改善了绝缘性能,从而降低了隧道结的漏电流。 By improving etching process and insulating layer growth process,we fabricated superconducting tunnel junctions with good performance.In order to decrease the etching of oxide layer and substrate during RIE,CF4 was used as etching gas.SiO2 is grown by using PECVD,to improve the performance of SiO2 insulation layer.Greatly improve the performance of the tunnel junction.
出处 《低温与超导》 CAS CSCD 北大核心 2012年第6期1-3,共3页 Cryogenics and Superconductivity
基金 国家自然科学基金(61027008 11074114)项目 国家重点基础研究发展计划项目(2011CBA00202)资助
关键词 Nb/A1-AlOX/Nb 隧道结 制备工艺 Fabrication Tunnel Nb/A1-AlOX/Nb
  • 相关文献

参考文献11

  • 1Hiroyuki Akaike,Takeaki Watanabe,Nobuyoshi Nagai,et al.Fabrication of Submicron Nb/AlO X-Al/Nb Tunnel Junctions Using Focused Ion Beam Implanted Nb Pat-terning(FINP)Technique[J].IEEE Trans.Appl.Su-perconduct.,1995,8(6).
  • 2查士同,曹春海,许钦印,李梦月,康琳,许伟伟,陈健,吴培亨.Nb/Al-AlO_x/Nb隧道结制备中压控电压源阳极氧化工艺研究[J].低温与超导,2010,38(5):31-33. 被引量:2
  • 3孙俊峰,石霞.PECVD SiO_2薄膜内应力研究[J].半导体技术,2008,33(5):397-400. 被引量:16
  • 4刘之景,刘晨.光科与等离子体刻蚀技术[J].实验技术,1999(7).
  • 5Nicolas Gherardi, Steve Martin, Francoise Massines. A new approach to SiO2 deposit using a N2 - SiH4 - N2O glow dielectric barrier - controlled discharge at atmos- pheric pressure [ J ]. 2000 (7).
  • 6Meng Xiaofan,Zheng Lizhen,Andre Wong.Micron and Submicron Nb/Al-AlO X/Nb Tunnel Junctions with High Critical Technique[J].IEEE Trans.Appl Super-conduct.,2001,9(3).
  • 7TakeshiImamura,Tetsuyoshi Shiota,Shinya Hasuo.Fab-rication of High Quality Nb/AlO X-Al/Nb Josephson Junctions:I-Sputtered Nb Films for Junction Electrodes Technique[J].IEEE Trans.Appl.Superconduct.,1992,10(1).
  • 8Takeshi Imamura,Shinya Hasuo.Fabrication of High Quality Nb/AlO X-Al/Nb JosephsonJunctions:II-Dep-osition of Thin Al Layers on Nb Films Technique[J].IEEE Trans.Appl Superconduct.,1992,8(2).
  • 9Tetsuyoshi Shiota,et al.Fabrication of High Quality Nb/AlO X-Al/Nb Josephson Junctions:III-Annealing Sta-bility of AlOx Tunneling Barriers Technique[J].IEEE Trans.Appl.Superconduct.,1992,7(4).
  • 10Kenichi Kuroda,et al.Niobium-stress Influence on Nb/Al-Oxide/Nb Josephson Junctions Technique[J].IEEE Trans.Appl.Superconduct.,1988,5(7).

二级参考文献12

  • 1刘必荣,Lenga.,M.Nb/AlO_x/Nb约瑟夫森结阳极氧化的实验研究[J].安徽大学学报(自然科学版),1994,18(2):19-33. 被引量:1
  • 2孙青,杨银堂,庄奕琪,张忠良.PECVD SiN薄膜应力的研究[J].微电子学与计算机,1989,6(6):21-24. 被引量:4
  • 3Meng Xiaofan,Zheng Lizhen,Andre Wong,et al.Micron and Submicron Nb/Al-AlOx/Nb Tunnel Junctions with High Critical[J].IEEE Trans.Appl.Superconduct.2001,11(3):365-368.
  • 4Takeshi Imamura,Tetsuyoshi Shiota,Shinya Hasuo.Fabrication of High Quality Nb/AlOx-Al/Nb Josephson Junctions:I-Sputtered Nb Films for Junction Electrodes[J].IEEE transactions on applied superconductivity,1992,2(1).
  • 5Takeshi Imamura,Shinya Hasuo.Fabrication of High Quality Nb/AlOx-Al/Nb Josephson Junctions:II-Deposition of Thin Al Layers on Nb Films[J].IEEE transactions on applied superconductivity,1992,2.
  • 6Tetsuyoshi Shiota,Takeshi Imamura,Shinya Hasuo.Fabrication of High Quality Nb/AlOx-Al/Nb Josephson Junctions:III-Annealing Stability of AlOx Tunneling Barriers[J].IEEE transactions on applied superconductivity,1992,2(4).
  • 7Kenichi Kuroda,Masahiro Yuda.Niobium-stress Influence on Nb/Al-Oxide/Nbosephson Junctions[J].J.Appl.Phys.1988,63(7),1.
  • 8Shinichi Morohashi,Shinya Hasuo,Toyoshi Yamaoka.Self-aligned Contact Process for Nb/Al-AlOx/Nb Josephson Junctions[J].Appl.Phys.Lett.,1986,48(3):20.
  • 9KINOSITA K. Recent developments in the study of mechanical properties of thin films [ J]. Thin Solid Films, 1972 : 12-17.
  • 10崔进炜.二氧化硅和氮化硅薄膜的等离子汽相淀积与应用[J].半导体技术,2000,25(4):15-17. 被引量:9

共引文献16

同被引文献17

  • 1民波.薄膜技术与薄膜材料[J].北京:清华大学出版社,2006.
  • 2Lotkhov S V,Tolkacheva E M, et al. Low hysteretic be- havior of A1/A1 - A1Ox/A1 Josephson junction [ J ]. Ap- pl. Phys. , 2006,89 : 132115.
  • 3Lang K M, Nam S, Aumentado J, et al. Banishing quan- siparticles from Josephson -junction qubit:Why and how to do it[Jl. IEEE Trans. Appl. Supercond. , 2003,13 : 989 - 991.
  • 4Berkley A J, Xu H, Guburd M A, et al. Decohe rence in Josephson junction qubit[ J]. Phys. Rev. B, 2003,68 : 060502.
  • 5Martinis J M. Superconducting phase qubit [ J ]. Quan- tum Inf. Process, 2009(8) :81 - 103.
  • 6高尚.衬底温度对PECVD法生长SiO2薄膜性能影响的研究[C].天津:中国光学学会2010年光学大会论文集,2010.
  • 7Mattia NegreIlo, Hopwood R, De Zotti G. The detection of a population of submillimeter bright strongly lensed g',dax - ies [ J/OL]. Science, 2010, 330:800 - 804.
  • 8Seiichiro Ariyoshi. Fabrication of superconducting direct detectors in subrnillimeter - wave bands [ D ]. Japan : The Graduate University for Advanced Studies, 2004.
  • 9高尚,连沽,宋平,等.衬底温度对PECVD法生长SiO:薄膜性能影响的研究//中国光学学会2010年光学大会论文集[C].
  • 10吕文龙,罗仲梓,何熙,张春权.PECVD淀积SiO_2的应用[J].功能材料与器件学报,2008,14(1):33-37. 被引量:15

引证文献2

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部