利用红外光谱仪快速测量塑料薄膜厚度

Thickness of plastic films measured by FT-IR technology

通过对塑料薄膜红外光谱的研究,得到了快速定量无损伤测量塑料薄膜厚度的方法:记录不同厚度的同种塑料薄膜傅里叶变换红外(FT-IR)光谱,应用朗伯-比尔定律,结合红外光谱分析法作出塑料薄膜的厚度与特征峰吸光度的工作曲线,从而快速、准确、无损伤地测量薄膜的厚度.同时建立了特征峰吸光度与厚度线性关系的数学模型,并对此种模型进行了验证.

This article presented a quantitative and friendly method to measure the thickness of plastic film rapidly from the Fourier transform infrared （FT-IR） spectra of the film. Applying the law of Lambert-Beer, the working curve was set up by analyzing the characteristic peaks in the infrared spectra of the plastic films of different thickness. Then a rapid, accurate, and nondestructive experimental method to measure the thickness of a film （or the number of layers） was created. At last, the linear relationship between the absorbance of the plastic and its thickness （layers） had been verified.