摘要
介绍了ＶＬＳＩ功能测试向量生成的Ｐｅｔｒｉ网模型和Ｐｅｔｒｉ网模拟测试序列中指令的关系，构造了压缩存储网络的拓扑信息的Ｐｅｔｒｉ网简约矩阵。用Ｐｅｔｒｉ网简约矩阵检查测试序列的不确定度，使测试序列不确定度最小，从而优化了测试序列，即从给定的指令中选出了最佳测试序列。
This paper introduces Petri net model of functional test pattern generation for VLSI. Relationships between operators involved in test sequence are accomplished via Petri. Reduced matrix compacting storage of net topology is constructed. Ambiguity of test sequence is checked via Petri net matrix. Test pattern is optimized and the best test sequence is got.
出处
《电子科技大学学报》
EI
CAS
CSCD
北大核心
2000年第2期178-181,共4页
Journal of University of Electronic Science and Technology of China
基金
国家"八五"重点科研项目
