纳米颗粒粒度测量方法进展

The Research Progress of Methods for Characterizing Nanoparticles

本文介绍了测量纳米颗粒粒度时应用广泛的几种方法:透射电镜观察法(TEM观察法)、扫描电镜(SEM)观察法、X射线衍射线宽法(谢乐公式)的原理、适用范围及其优缺点。文中介绍了纳米测量技术的发展趋势并简单总结了动态光散射法、超声测量法的发展现状。动态光散射法、超声测量法具有不破坏、不干扰体系原有状态的优点,特别适用于工业化生产中产品粒径的检测。

The several common methods for measuring nanoparticle size such as TEM,XRD,SEM are discussed in terms of their principles,applications,advantages and disadvantages.Characterizing Nanoparticles by DLS and ultrasound method is discussesed in this paper also.DLS and ultrasound method has the virtues of measuring nanoparticle size without destroying and disturbing the intrinsic state of the system,which is a preferred method and suitable in particular for measuring the size of industrial products.