半导体激光治疗牙本质过敏症疗效观察

Clinical Observation of Semiconductor Laser for Treatment of Hypersensitivity of the Dentine

目的 通过临床和扫描电镜观察半导体激光治疗牙本质过敏症的作用 ,并探讨其作用机制。方法 牙本质过敏的患牙 10 0颗 ,分为两组 ,一组用半导体激光治疗 ,一组用常规氟化钠脱敏。结果 用半导体激光治疗的患牙其敏感症状立即降低 ,即刻有效率达 96 % ;而用氟化钠治疗的患牙 ,即刻有效率为 76 % ,两者有显著性差异 (P<0 0 1)。扫描电镜显示 ,用半导体激光仪照射后 ,牙本质小管口被封闭。结论 半导体激光治疗为一种安全、有效、方便的牙本质过敏症的治疗方法。

Objective Observation of clinical results and SEM features in treatment of hypersensitive dentine by semiconductor laser.Methods Semiconductor laser was compared with conventional NaF method for the treatment of 100 teeth with typical hypersensitive dentine which were divided into two groups.Results The efficiency of the laser group was 96%,while that of NaF group was 76%.The laser irradiation could decrease hypersensitive dentine.There was marked difference between two groups.It was testified by SEM that the dentinal tubule was sealed by semiconductor laser irradiation.Conclusion The safe,effective and easy method was provided for treating the hypersensitive dentine by use of semiconductor laser.