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改进型QCA共面交叉电路的可靠性分析 被引量：2

Reliability Analysis of the Improved QCA Coplanar Crossover Circuit
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摘要 针对量子元胞自动机(QCA)电路中电路单元复杂化能提高电路可靠性的假设,采用概率转移矩阵对一种改进后的QCA共面交叉电路单元及原始电路单元的可靠性进行对比分析,以检验复杂化设计能否提高电路可靠性,并利用四选一数据选择器进行深入研究以验证分析结果。仿真结果表明,该改进方案将共面交叉电路单元应用于单独运行及组合电路中分别使电路的可靠性降低了19.6%和0.84%。改进后的电路单元不但没有提高可靠性,反而由于电路结构的复杂化降低了其可靠性。 According to the hypothesis that the increase of the circuit units complexity can improve the reliability of the quantum-dot cellular automata（QCA） circuit,the probabilistic transfer matrix method was applied to the comparative analysis of the improved QCA coplanar crossing circuit units and original circuit units to verify whether or not the complex design can improve the reliability of the circuits.Besides that,the 4-to-1 data selector was used to verify the results of the analysis in further study.The final simulation result shows that while running separately and in combinational circuit,the improved QCA circuit units make the reliability of the circuit reduce by 19.6% and 0.84%,respectively.The reliability of the improved circuit units is reduced,not improved due to the complex circuit structure.
作者 岳洋洋 解光军 吕洪君
机构地区 合肥工业大学电子科学与应用物理学院
出处 《微纳电子技术》 CAS 北大核心 2012年第6期369-374,共6页 Micronanoelectronic Technology
基金 安徽省自然科学基金资助项目(1208085MF102)
关键词 量子元胞自动机(QCA) 概率转移矩阵 共面交叉 数据选择器 可靠性 quantum-dot cellular automata（QCA）； probabilistic transfer matrix； coplanar crossover； data selector； reliability
分类号 TN406 [电子电信—微电子学与固体电子学]
  • 相关文献

参考文献9

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二级参考文献11

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共引文献3

同被引文献28

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二级引证文献1

微纳电子技术
2012年 第6期

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