摘要
A polarization Fizeau interferometer based on birefringent thin film is presented.The interferometer adopts a birefringent thin film to obtain orthogonally polarized and strictly common-path reference and test beams.Advantages include ease of implementation on large-aperture interferometer,measuring test optics from long distance,and achieving high fringe visibility.The phase shift is obtained by combining a quarterwave plate and an analyzer.The concepts illustrated are verified experimentally.
A polarization Fizeau interferometer based on birefringent thin film is presented.The interferometer adopts a birefringent thin film to obtain orthogonally polarized and strictly common-path reference and test beams.Advantages include ease of implementation on large-aperture interferometer,measuring test optics from long distance,and achieving high fringe visibility.The phase shift is obtained by combining a quarterwave plate and an analyzer.The concepts illustrated are verified experimentally.
基金
supportedby the National Natural Science Foundation of China(No. 60808018)
the State Key Laboratory of Applied Optics, China (No. Y1Q03FQK06)
