专利审查行为对技术创新的影响机理研究

Study on the impact mechanism of the patent examination behavior on technological innovation

为了缓解越来越严峻的审查压力,各主要专利局近年来频繁对专利系统从审查行为的角度进行改革。本文对专利审查行为影响技术创新的机理从审查质量、审查周期和费用三个维度进行了系统分析,研究认为专利审查的犯错率过高、专利审查的周期过长、专利审查的费用标准过低,对技术创新可能产生阻碍效应。同时,专利审查系统内部存在审查质量与审查周期的相互影响关系,而在专利审查系统外部也存在专利审查行为与技术创新的循环影响关系。为此,本文提出我国专利局在缓解审查积压时,为了在保持审查系统内部平衡的基础上改善专利审查行为与技术创新间循环回路的运行效应,应尽快提高我国专利审查费用的标准和建立快速审查请求制度。

In order to alleviate the increasingly severe examination pressure in recent years, all major patent offices have frequently im- plemented reforms from the perspective of patent examining behavior. The systematic analysis in this paper has been conducted in un- derstanding the mechanism of the patent examination impacts upon technological innovation, This mechanism is built from the following three dimensions： improperly high error rate, excessively long examination period and unnecessarily low patent examination fees. These phenomena will hinder technological innovation. Meanwhile, mutual impacts of examination quality and examination period in the inter- nal patent - auditing institution and escalating interrelationships between patent examination and technological innovation also exist out- side official patent examination system. It is concluded that the standard of patent examination fees and establish the quickly examina- tion of request system should formulated so as to relax the backlog of patent applications and improve the effectiveness of enhancing technological innovation through patent examining behavior while maintaining the internal patent examination balance.