纳米云纹法实验研究

Experimental study on nanometer moire method

结合原子力显微镜技术提出了一种新型纳米云纹方法 ,并应用该方法进行纳米范围的变形。实验中选用原子力显微镜显示屏的扫描线做为参考栅 ,云母和高纯定向石墨的晶格结构做为试件。对纳米云纹形成原理及测量方法进行了详尽讨论。运用该方法对强脉冲激光辐照激光照射之后云母试样的剩余变形进行测量研究。成功的实验结果表明这种方法是可行性的 ,可望在纳米力学行为研究中获得广泛应用。

A new scanning moire method is developed to measure in-plane deformation of mica using an atomic force microscope, Moire pattern are formed by the scanning lines of the CRT in AFM system, and the atomic lattice of the mica or high orientated pyrolytic graphite (HOPG). The principle of measurement and the techniques for grating preparation are described in detail. This new method is used to measure the residual deformation of a mica plate after being irradiated by a Nd-YAG laser, and to determine the residual strain of HOPG under a tensile load. Some interesting results are obtained. The successful results verify the feasibility of this method to measure deformation in the nanometer range using the lattice of material as the model grid.