摘要
微波功率频移是影响铷原子频标中长期稳定度的重要因素之一。本文对形成铷原子频标中微波功率频移的机理进行分析研究,对铷原子频标的C场场强、光强和微波场强的均匀性进行优化改进,以减小铷原子频标的微波功率频移敏感性。通过试验测试,进一步验证了形成铷原子频标微波功率频移的机理;总结了铷原子频标微波功率频移的主要特点;并得出在铷原子频标信噪比最大处,铷原子频标的微波功率频移系数优于3.5×10-12 dB-1。
Microwave power frequency shift is an important factor for the rubidium atomic frequency standards’ stability.The mechanism of microwave power frequency shift was studied.Experiments were developed to improve the equality of the C field,light field and microwave field for reducing the coefficient of microwave power frequency shift.The mechanism of microwave power frequency shift was validated and the major characteristic of microwave power frequency shift for rubidium atomic frequency standards was induced through the experiment of microwave power frequency shift.The results show that the coefficient of microwave power frequency shift is less than 3.5×10-12 dB-1 without the attenuation of signal-to-noise.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
2012年第6期764-768,共5页
Atomic Energy Science and Technology
关键词
铷原子频标
微波功率频移
交流塞曼效应
rubidium atomic frequency standards
microwave power frequency shift
AC Zeeman effect