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一种新型宽范围固定上升沿的数字占空比矫正电路 被引量:1

A novel wide-range digital duty-cycle-correction circuit with fixed rising edges
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摘要 提出一种应用于FPGA中的新型宽调整范围的数字占空比矫正电路.该电路在0.13μm CMOS标准工艺下实现,具有固定上升延时的特性.通过采用连续逼近寄存器,实现了占空比的快速调整.测试结果表明,其调整范围为10%~85%,在80~250 MHz输入范围内输出占空比变化为50%±2%,所需调整时间为6个时钟周期. A novel all-digital CMOS duty-cycle-correction (DCC) circuit with wide correction ranges of input duty cycle is proposed in FPGA. The proposed DCC circuit has the fixed rising edge. A successive approximation register circuit is utilized to reduce the adjusting time of the DCC. The proposed circuit is fabricated in a 0. 13 μm CMOS standard technology. Measurement results show that the DCC adjusts the output duty cycle to 50% ±2% for a wide input duty cycle range from 10% to 85%. The DCC could operate within a frequency range from 80 MHz to 250 MHz with the adjusting time of 6 clock cycles.
出处 《中国科学院研究生院学报》 CAS CSCD 北大核心 2012年第4期501-506,共6页 Journal of the Graduate School of the Chinese Academy of Sciences
基金 国家高技术研究发展计划(863)(2008AA010701)资助
关键词 占空比矫正 连续逼近寄存器 占空比检测 duty cycle correction successive approximation register duty detector
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参考文献11

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同被引文献12

  • 1张炜华,姚若河,吴桐庆.一种改进的模拟占空比矫正电路[J].微电子学与计算机,2007,24(3):174-177. 被引量:1
  • 2何小威,陈亮,冀蓉,李少青,曾献君.基于相位合成的时钟50%占空比调节电路设计[J].电子学报,2007,35(8):1572-1576. 被引量:2
  • 3杜振场,殷勤,吴建辉,潘开阳.一种固定下降沿的高精度时钟占空比调整电路[J].微电子学,2007,37(5):739-743. 被引量:2
  • 4Gu J,Wu J,Gu D,et al.All-digital wide range precharge logic 50% duty cycle corrector[J].IEEE Trans on Very Large Scale Integration Systems,2012,20(4):760-764.
  • 5Min Y J1Jeong C H,Kim K Y,et al.A 0.31-1 GHz fast-corrected duty-cycle corrector with successive approximation register for DDR DRAM application[J].IEEE Trans on Very Large Scale Integration Systems,2012,20(8):1524-1528.
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  • 8张炜华,姚若河,朱建培.一种新型的模拟占空比矫正电路[C]//第十四届全国半导体集成电路、硅材料学术年会.北京:出版者不详,2005.
  • 9李华,钟正,方粮,等.占空比调节器的设计与实现[C]//第十二届计算机工程与工艺全国学术年会.呼和浩特:出版者不详,2008.
  • 10Cheng K,Su C,Chang K.A high linearity,fast-locking pulse width control loop with digitally programmable duty cycle correction for wide range operation[J].IEEE Journal of Solid-state Circuits,2008,43(2):399-413.

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