期刊文献+

基于ASAAC标准的BIT设计 被引量:7

Design of BIT Based on ASAAC Standard
下载PDF
导出
摘要 为满足航空电子系统的可测试性,降低航空电子系统测试维护成本,结合ASAAC标准设计一个机内自测试(BIT)系统。BIT利用自身资源对系统进行故障检测或隔离,采用总线层次化方法将BIT设计分为系统级、分系统级及模块级3层测试结构,并给出模块级测试的软硬件设计方案。测试结果表明,该系统能使测试与航电系统的健康管理和故障管理紧密结合,在满足测试覆盖率等技术指标的同时,提高航空电子系统可靠性与可测试性。 To meet the avionics electronic system testability and reduce avionics electronic system test and maintenance costs,this paper designs a Built-in Test(BIT) system referring to ASAAC standard.BIT is defined as a capability provided by electronic system itself for the fault detection or isolation.As a Hierarchy design,it divides the BIT system into three levels,system level,subsystem level and module level,and makes a design in details containing software and hardware design for module level test.Test results show that the system can make the test combining with the health management and fault management of avionics electronic systems more closely.It meets technical indicators and greatly improves avionics electronic system reliability and testability.
出处 《计算机工程》 CAS CSCD 2012年第12期228-231,235,共5页 Computer Engineering
关键词 ASAAC标准 BIT设计 航空电子系统 故障管理 可测试性 可靠性 ASAAC standard BIT design avionics electric system fault management testability reliability
  • 相关文献

参考文献8

二级参考文献19

共引文献40

同被引文献41

  • 1邹喆,孟令琴,吕丹丹.半模基片集成波导双频滤波功分器的设计[J].电子测量技术,2020(11):29-33. 被引量:1
  • 2陈卫兵,陈键.一种RAM自检的新方法[J].工业控制计算机,2006,19(9):69-69. 被引量:6
  • 3张超,马存宝,宋东,许家栋.智能机内测试研究综述[J].计算机测量与控制,2007,15(2):141-144. 被引量:15
  • 4Avionics Application software standard Interface[S]. Aeronautical Radio, inc, 2005.
  • 5vxworks_653_programmers_guide_22[M]. WindRiver Systems, inc, 2007.
  • 6Partitioning in Avionics Architectures Requirements Mecha- nisms and Assurance[R]. NASA, 2000.
  • 7王运盛,陈颖.ASAAC航空电子体系结构标准分析[J].电讯技术,2007,47(5):159-162. 被引量:8
  • 8Freescale Semiconductor Inc.Programming Environments Manual for 32-Bit Implementations of the PowerPC? Architecture [R].USA:Freescale Semiconductor,Inc.Rev.3,9/2005.
  • 9Freescale Semiconductor Inc.MPC8641D Integrated Host Processor Family Reference Manual [Z].USA Freescale Semiconductor,Inc.Rev.0.07/2006.
  • 10Robert X Gao. Guest editorial special section on built - in -test [ J ]. IEEE Transactions on Instrumentation and Measure- ment, 2005,54 (3) :939 - 940.

引证文献7

二级引证文献19

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部