摘要
确定了用X射线荧光光谱法测定砂岩中SiO2、Al2O3、CaO、MgO的含量的最佳测定条件,该方法简单、分析速度快,SiO2、Al2O3、CaO、MgO的相对标准偏差分别为0.22%、1.9%、5.3%、6.1%,结果稳定可靠。经大量试验证明,采用此法测定,操作方便,准确度高,结果令人满意。
The optimum conditions for determining contents of silicon oxide, alumina oxide, calcium oxide and magnesium oxide in sandstone by X-ray fluorescence spectrometry were determined. The RSD was 0.22%, 1.9%, 5.3% and 6.1% for silicon oxide, alumina oxide, calcium oxide and magnesium oxide, respectively. This method is simple, rapid and precise, reliable and stable results can be gained.
出处
《当代化工》
CAS
2012年第6期653-654,共2页
Contemporary Chemical Industry
关键词
X射线荧光光谱法
砂岩
二氧化硅
三氧化二铝
氧化钙
氧化镁
X-ray fluorescence spectrometry methods
Sandstone
Silicon oxide
Alumina oxide
Calcium Oxide
Magnesium oxide