基于OpenCv的石英晶片缺陷检测

Defect detection of quartz crystal based on OpenCv

针对石英晶片在生产制造过程中会产生物理缺陷的问题,提出了基于计算机视觉库OpenCv的石英晶片缺陷检测方法。通过对石英晶片图像进行平滑滤波、二值化处理、边缘检测,将处理后的图片与标准模板进行匹配,从而确定晶片是否存在缺陷。实验结果表明采用OpenCv进行图像处理比采用传统的图像处理代码,程序更简洁,执行效率更高,能较好地完成对晶片的缺陷检测。

To solve the problem of physical defect produced among manufacturing process of quartz crystal, the method of quartz crystal defect detection based on computer vision library OpenCv is presented. First, quartz crystal image is dealt with by grayseale conversion, filtering and image binarization. Then the processed image is matched with the standard template, in order to determine whether the chip is defective. Results show the use of OpenCv image processing gives a more concise and efficient program than using the traditional one.