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高分辨率中阶梯光栅光谱仪精确装调与标定 被引量:7

A Method of Precise Adjustment and Calibration for High-Resolution Echelle Spectrograph
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摘要 中阶梯光栅光谱仪是一种高分辨率、高精度新型光谱仪器,其分辨率可达到几万至几十万,结构参数的微小偏差严重影响着其分辨率和波长标定精度,所以精确的装调方法是保证中阶梯光栅光谱仪性能指标的重要环节之一。针对中阶梯光栅光谱仪的结构特点,对中阶梯光栅光谱仪精确装调方法进行了研究。该方法简便、快捷,适用于小体积、封闭式结构设计的中阶梯光栅光谱仪。通过该方法的装调,使中阶梯光栅光谱仪工作状态与设计结果一致。给出了最终波长标定结果,其波长标定误差小于0.002nm,满足系统性能要求。 Echelle spectrograph is a new type of high-resolution, high-precise spectrograph, and its resolution can be up to tens of thousands to hundreds of thousands. In this case, a little error of the structure will affect the resolution and precision greatly, so an accurate adjustment is of importance for the echelle spectrograph. According to the design features, the present paper discusses the adjustment method for echelle spectrograph. This is an uncomplicated, quick method, and adapts to mini, airproof structure of echelle spectrograph. Using this method, the actual state is consistent with the design result. The result of wave-length calibration is given out, and the error is less than 0. 002 nm, which satisfies the requirement of the system.
出处 《光谱学与光谱分析》 SCIE EI CAS CSCD 北大核心 2012年第8期2280-2285,共6页 Spectroscopy and Spectral Analysis
基金 国家自然科学基金项目(61108032) 吉林省科技支撑计划项目(20106011)资助
关键词 中阶梯光栅光谱仪 中阶梯光栅 离轴抛物镜 波长标定 Echelle spectrograph Echelle grating Off-axis parabolic mirror Wavelength calibration
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  • 1Xu Lina, Davonport Mark A, et al. SPIE, 2011, 8165: 81650E1.
  • 2Tousey R, Purcell j D, Garrett D L. Applied Opitcs, 1967, 6(3): 365.
  • 3Koch J, Okruss M, Franzke J, et al. Spectrochimica Acta, Part B, 2004, 59: 199.
  • 4Florek S, Haisch C, Okruss M, et al. Speetroehimica Acta, Part B, 2001, 56: 1027.
  • 5LINa-na,ANZhi-yong,CUIJi-chang(李娜娜,安志勇,崔继承).光学精密工程,2009,17(3):531.
  • 6Frank Grupp, Shaoming Hu, Liang Wang. Proc. of SPIE, 2009, 7440: 7440G.
  • 7Frank Grupp, Thomas Udem, et al. Proc. of SPIE, 2010, 7735: 7735731.
  • 8TANGYu-guo,SONGNan,BayanhesKg,etal(唐玉国,宋楠,巴音贺希格,等).光学精密工程.2010,18(9):1989.
  • 9梁培.离轴抛物镜准直特性的研究[J].光学学报,2006,26(6):909-913. 被引量:14
  • 10SHIHong-bin,CHENGZhao-gu,XUGuo-lialag,etal(石鸿斌,程兆谷,许国良,等).中国激光,2000,27(10):880.

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同被引文献78

  • 1哈特雷.衍射光栅[M].贾惟义,秦小梅,译.贵阳:贵州人民出版社,1990.
  • 2李国玉,刘波,郭团,张键,袁树忠,开桂云,董孝义.基于线阵InGaAs光电二极管阵列的光纤光栅传感解调[J].光子学报,2007,36(9):1591-1594. 被引量:19
  • 3Chu R S, Tamir T. Wave propagation and disper- sion in space-time periodic media [J]. Proc. Inst. Elec. Eng. , 1972,119 : 797-806.
  • 4G R Harrison. The production of diffraction gratings I. development of the ruling art [J]. J Opt Soe Am, 1949, 39(6): 413-426.
  • 5H B Ross, M Okruss, S Florek, et al: Echelle spectrograph as a tool for studies of structured background in flame atomic absorption spectrometry [J]. Spectrochimica Acta Part B. 2002, 57(10): 1493-1504.
  • 6Jean-Francois I.avigne, M Doucet, M Wang, et al: Study of the image quality and stray light in the critical design phase of the compact echelle spectrograph for aeronomical research (CESAR) [C]. SPIE, 2010, 7735: 773539.
  • 7R Tousey, J D Purcell, D I. Garrett. An echelle spectrograph for middle ultraviolet solar spectroscopy from rockets [J]. Appl. Opt., 1967, 6(3): 365-372.
  • 8H P, ecker Ross, S Florek, U Heitmann, et al: Continuum source atomic absorption spectrometry and detector technology: a historical perspective [J]. Spectrochimica Acta Part B, 2006, 61 (3): 1015-1030.
  • 9K Liu, G M Hieftje. Investigation of wavelength calibration for an echelle cross-dispersion spectrometer [J]. J. Anal. At. Spectrom. , 2003, 18(1) : 1177-1184.
  • 10P. Lindblom. New compact echelle spectrographs with multichanneI time-resolved recording capabilities [J]. Analytica Chimiea Acta, 1999, 380(3): 353-361.

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