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铜线封装工艺技术和可靠性研究

Cu bonding assembly for process and reliability analyses
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摘要 铜线键合工艺作为当前框架类集成电路封装降低成本的重要措施,但是,铜线带来的相关工艺调整和可靠性认证,以及客户的认证都是当前需要产品公司考虑的问题。本文对于铜线键合工艺和可靠性从多方面进行了研究,对该研究的发展具有借鉴和推广价值。 Copper bonding processes are the important method to cost down for frame species assembly chip. Bul copper bonding processes should carry out assembly process adjust and quality audit. And customer should accept the new assembly improvement. We research the process and reliability of the copper bonding, and the results could help the research of the field.
作者 聂纪平
出处 《中国集成电路》 2012年第7期65-67,83,共4页 China lntegrated Circuit
关键词 铜线键合 封装可靠性 集成电路封装 Copper bonding, assembly quality, IC assembly
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  • 1田艳红,杭春进,王春青.Cu丝超声球焊及楔焊焊点可靠性及失效机理研究[J].电子工艺技术,2006,27(2):63-69. 被引量:7
  • 2田艳红,孔令超,王春青.芯片互连超声键合技术连接机制探讨[J].电子工艺技术,2007,28(1):1-5. 被引量:7
  • 3宗飞,田艳红,王春青.Cu引线超声键合动态过程有限元模拟[J].电子工艺技术,2007,28(4):187-190. 被引量:5
  • 4Dominiek Degryse,Bart Vandevelde,Eric Beyne.Mechanical FEM simulation of bonding process on Cu / low-k wafers[J].IEEE transactions on components and packaging technologies,2004,27 (4):643-650.
  • 5Chang-Lin Yeh,Yi-Shao Lai,Jenq-Dah Wu.Dynamic analysis of wire bonding process on Cu / low-k wafers[C].Electronics Packaging Technology Conference,Singapore,2003.282-286.
  • 6Yong Liu,Scott Irving,Timwah Luk.Thermosonic wire bonding process simulation and bond pad over active stress analysis[C].Electronics Packaging Technology Conference,Las Vegas,USA,2004.383-391.
  • 7Jian Chen,Doninick Degryse.Mechanical Issues of Cu-toCu wire bonding[J].IEEE transactions on components and packaging technologies,2004,27 (3):539-545.
  • 8Sarangapani Murali,Narasimalu Srikanth,et al.Effect of wire diameter on the thermosonic bond reliability[J].Microelectronics Reliability,2006 (46):467-475.
  • 9Yanhong Tian,Chunqing Wang,Ivan Lum,et al.Investigation of Ultrasonic Copper WLre Wedge Bonding on Au/Ni plated Cu Substrates at Ambient Temperature[J].Journal of Materials Processing Technology,2007,12.
  • 10杨平,李春梅,周康武,崔凤娥,刘德明.微电子封装铜线键合的组织与微织构[J].中国体视学与图像分析,2007,12(4):274-277. 被引量:4

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