基于TCL语言和边界扫描技术的存储器测试脚本设计

Design of memory test script based on TCL language and boundary scan test

为了提高存储器的边界扫描测试软件的通用性,提出一种基于TCL语言及边界扫描技术的存储器测试脚本设计方案。结合存储器测试理论及边界扫描逻辑簇测试技术,研究基于TCL脚本语言的存储器测试脚本设计方法,用以在进行存储器簇测试时描述存储器自身的读写特性及与其外部边界扫描测试单元的连接关系等,并给出HY6264SRAM静态存储器功能测试的例子。通过测试验证,使用TCL脚本语言与高级语言联合编程能够提高边界扫描测试软件的工作效率。

In order to improve the versatility of the memory of the boundary-scan test software, a design of memory test script based on tool command language（TCL） and boundary Scan technology is proposed, coupling with the the- ory of memory test, the boundary scan logic clusters test technology and SRAM function test methods are intro- duced. Memory test script using the TCL language is designed to describe the read and write characteristics of mem- ory and its relationship with the external boundary-scan test unit. An example of HPA6264SRAM test is given fi- nally. Experimental results show that the efficiency of boundary scan test software is improved by using TCL scri- ping language and high-level language programming.