平响应X射线二极管辐射能流还原率提高方法

Weighting method to improve recovery ratio of radiation flux for flat response X-ray diffraction

惯性约束聚变实验中使用平响应X射线二极管(XRD)阵列从不同方向测量黑腔辐射能流的时间演化过程和角分布。平响应XRD的谱响应曲线存在局部不平整,给辐射能流的还原引入了误差。为减小由于能谱形状和平响应局部不平带来的还原误差,提出了加权求解平响应XRD的平均响应值的方法。对该方法提高辐射能流的还原率的必要条件进行了研究。改进后的方法应用于实验数据的处理,结果表明:修正后的等效积分温度随时间的演化过程与多道软X光能谱仪吻合较好。

In inertial confinement fusion（ICF） experiments,the flat response X-ray diode（XRD） array is used to detect the evolution of radiation fluxes of the hohlraum from different directions.The spectrum response of flat response XRD is not perfectly flat,which introduces uncertainty into the recovery of the radiation flux.Thus a weighting method is developed to reduce the errors caused by the spectral shapes and local oscillations of the flat response.The condition under which the recovery ratio will be improved is studied.The method has been used to analyze ICF experiment data,and the modified time history of equivalent integral temperature obtained has a good agreement with the measurements of a multi-channel soft-X-ray spectrometer.