小麦发育后期茎秆抗倒伏性的数学模型

Mathematical Model of Lodging Resistance at Late Stage of Wheat Growth

对小麦发育后期茎秆抗倒伏性进行了研究.建立了基于茎秆密度和机械强度的改进型抗倒伏指数模型;采用相关系数、通径分析、灰色关联分析三种方法对倒伏指数与外部形态的关联性进行了分析;提出了理想株型结构的定义,建立双目标优化模型探讨理想模型的数值解;分别从茎秆线密度线性变化、分节几何性质均匀以及分节物理性质均匀的情况下获得三个抗倒伏模型;最后为小麦茎秆抗倒伏研究提出了建议.

This paper discusses the related issues about lodging resistance at late stage of wheat growth. Lodging resistance index is established based on stalk density and mechanical strength. Correlation coefficient, path analysis and gray correlation analysis are employed to ascertain the influence elements. A double objective optimization model is built up to research the ideal plant type. Three lodging resistance models are established based on stalk linear density linearly changing, geometric property equally distributing and physical property equally distributing. Finally several suggestions about lodging resistance researching are given based on the above study.