期刊文献+

Measurement accuracy verification of aspheric surface test with computer-generated hologram

Measurement accuracy verification of aspheric surface test with computer-generated hologram
原文传递
导出
摘要 A convex aspheric surface using a computer-generated hologram (CGH) test plate fabricated with novel techniques and equipment is tested. However, the measurement result is not verified via comparison with other methods. To verify the accuracy of the measurement, a perfect sphere surface is measured by the following. The measurement result is quantified into four parts: the figure error from the tested spherical surface; the figure error from the reference spherical surface; the error from the hologram; and the adjustment error from misalignment. The measurement result, removed from the later three errors, shows agreement to 4-nm RMS with the test by Zygo interfermeter of the same surface. Analysis of the CGH test showed the overall accuracy of the 4-nm RMS, with 3.9 nm from the test plate figure, 0.5 nm from the hologram, and 0.74 nm from other sources, such as random vibration, various second order effects, and so on. Thus, the measurement accuracy using the proposed CGH could be very high. CGH can therefore be used to measure aspheric surfaces accurately. A convex aspheric surface using a computer-generated hologram (CGH) test plate fabricated with novel techniques and equipment is tested. However, the measurement result is not verified via comparison with other methods. To verify the accuracy of the measurement, a perfect sphere surface is measured by the following. The measurement result is quantified into four parts: the figure error from the tested spherical surface; the figure error from the reference spherical surface; the error from the hologram; and the adjustment error from misalignment. The measurement result, removed from the later three errors, shows agreement to 4-nm RMS with the test by Zygo interfermeter of the same surface. Analysis of the CGH test showed the overall accuracy of the 4-nm RMS, with 3.9 nm from the test plate figure, 0.5 nm from the hologram, and 0.74 nm from other sources, such as random vibration, various second order effects, and so on. Thus, the measurement accuracy using the proposed CGH could be very high. CGH can therefore be used to measure aspheric surfaces accurately.
作者 刘华
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2012年第7期37-40,共4页 中国光学快报(英文版)
基金 supported by the National Natural Science Foundation of China under Grand No.61137001
关键词 Electron holography HOLOGRAMS SPHERES Electron holography Holograms Spheres
  • 相关文献

参考文献14

  • 1A. Offner and D. Malacara, Optical Shop Testing (Wiley, New York, 2007).
  • 2M. V. Mantravadi, V. Kumar, and R. J. von Handorf, Proc. SPIE 1332, 107 (1990).
  • 3J. H. Burge, Proc. SPIE 2576, 258 (1995).
  • 4J. H. Burge and D. S. Anderson, Proc. SPIE 2199, 181 (1994).
  • 5Y. Xie, Z. Lu, F. Li, J. Zhao, and Z. Weng, Opt. Express 10, 1043 (2002).
  • 6J. Ma, Z. Gao, R. Zhu, Y. He, L. Chen, J. Li, E. Pun, W. Wong, L. Huang, and C. Xie, Chin. Opt. Lett. 7, 70.(2009).
  • 7Y. Xie, Z. Lu, and F. Li, Opt. Express 11,992 (2003).
  • 8Y. Xie, Z. Lu, and F. Li, Opt. Express 11, 975 (2003).
  • 9Y. Xie, Z. Lu, and F. Li, Opt. Express 12, 1810 (2004).
  • 10H. Liu, Z. Lu, and F. Li, Opt. Laser Technol. 37, 642 (2005).

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部