2L. Briand, D. Pfahl, Using Simulation for Assessing the Real Impact of Test Coverage on Defect Coverage. IEEE Transactions on Reliabil- ity[ J]. 2000,49( 1 ) : 60 -70.
3YE N. A Markov chain model of temporal behavior for anomal de- tec-tion[ A ]. 2000 IEEE Sytem, Man, and Cybernetics Information As-surance and Security Workshop[ C ]. West Point, NY ,2000.
4S. Mankefors, R. Torkar and A. Boklund. New Quality Estimations in Random Testing, 14th International Symposium on Software Reliabil- ity Engineering, [ J ]. 2003:468 - 478.
5JHA S, TAN K, MAXION R. Markov chains, classifiers, and intrusion detection [ A ].Computer Security Foundation Workshop, the 14th IEEE [ C ]. Cape Breton, Novia Scotia, Canada,2001.
