期刊文献+

密勒运算跨导放大器的单粒子瞬变效应分析

Analysis of Single-Event Transients in Miller Operational Transconductance Amplifier
下载PDF
导出
摘要 从2阶闭环系统的角度出发,推导并分析了单粒子瞬变(SET)电流在密勒运算跨导放大器(OTA)中的传导效应。通过理论分析,发现OTA两级跨导比例(Gm2/Gm1)的大小不仅决定了系统闭环的稳定性,也决定了SET电流在系统输出端电压响应的振动幅度和恢复时间。在标准0.18μm CMOS工艺下,通过改变两级跨导的比例值,对电路的两个有效节点进行电路级SET轰击实验,收集实验结果,给出抗SET效应运算放大器的设计建议。 Propagation of single-event transients (SET) in Miller operational transconductance amplifier (OTA) was extrapolated and analyzed based on a 2nd-order closed-loop system. It was found that the transconductance ratio of the two stages of OTA would affect damping factor, which affects not only stability of the OTA, but also swing of SET voltage response and recovery time at output of the OTA. Based on a standard 0. 18 μm CMOS process, SET simulations were made at circuit level by changing damping factor represented by transconductance ratio of the two stages. Experimental results were collected and recorded, which is helpful for radiation-hardening design of the OTA.
出处 《微电子学》 CAS CSCD 北大核心 2012年第4期449-453,457,共6页 Microelectronics
基金 国家自然科学基金资助项目(61076025 60906009)
关键词 单粒子瞬变 运算跨导放大器 2阶系统 Single-event transient Operational transconductance amplifier Second order system
  • 相关文献

参考文献7

  • 1STERNBERG A L, MASSENGILL L W, BUCHNER S, et al. The role of parasitic elements in the single- event transient response of linear circuits [J].IEEE Trans Nucl Sci, 2002, 49(6): 3115-3120.
  • 2HARBOE S R, DALY E, TESTON F, et al. Observation and analysis of single event effects on- board the SOHO satellite [C] // 6th Europ Conf Rad Effects Compon Syst. 2001: 37-43.
  • 3PRITCHARD E, SWIFT G M, JOHNSON A H. Radiation effects predicted, observed, and compared for spacecraft systems [C]// IEEE Rad Effects Data Works. 2002: 7=13.
  • 4NICHOLS D K, COSS J R, MIYAHIRA T F, et al. Heavy ion and proton induced single event transients in comparator [J]. IEEE Trans Nucl Sci, 1996, 43(6) : 2960-2967.
  • 5KOGA R, PENZIN S H, CRAWFORD K B, et al.Single event upset sensitivity dependence of linear integrated circuits on bias conditions [J].IEEE Trans Nuel Sci, 1997, 44(6): 2325-2332.
  • 6BOULGASSOUL Y, MASSENGILL L W, TURFLINGER T Y, et al. Frequency domain analysis of'analog single-event transients in linear circuits [J]. IEEE Trans Nucl Sci, 2002, 49(6): 3142-3147.
  • 7GEORGE J, KOGA R, CRAIN S, et al. Single event transients in operational amplifiers [C] // IEEE Rad Effects Data Works. 2005: 8-12.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部