一种新的红外焦平面阵列盲元检测算法

A New Algorithm of Blind-Pixel Detection for IRFPA

受材料、制造工艺等因素的影响,红外焦平面阵列探测器均存在一定数量的盲元。在分析探测单元响应特性的基础上,提出一种双参考辐射源+定义检测算法。实验结果表明,该算法具有盲元误检率低,查找快速等优点。

Due to the influence of material, fabrication technology and so on, blind-pixels exist on infrared focal plane array detectors. A particular analysis on the response characteristic of the blind-pixel was made firstly, and then a definition method using two reference radiation sources for blind-pixel detection was presented. The result of simulation shows the detection has the advantages of low misdetection rate and fast search.