摘要
Mid-infrared transmittance of submicron silver slit arrays was numerically studied with the finite difference time domain method. The slit width varies from 50 nm to 300 nm and a square feature may attach at either or both slit sides. Although the side length of features is one or two orders of magnitude shorter than the wavelength, the attached nanoscale features can modify the transmittance significantly. The transmittance was also further investigated in detail by looking into the electromagnetic fields and Poynting vectors of selected slit geometries. The investigation results show that such change can be attributed to the cavity resonance effect inside the slit arrays. The work is of great importance to the wavelength-selective devices design in optical devices and thermal application fields.
Mid-infrared transmittance of submicron silver slit arrays was numerically studied with the finite difference time domain method. The slit width varies from 50 nm to 300 nm and a square feature may attach at either or both slit sides. Although the side length of features is one or two orders of magnitude shorter than the wavelength, the attached nanoscale features can modify the transmittance significantly. The transmittance was also further investigated in detail by looking into the electromagnetic fields and poynting vectors of selected slit geometries. The investigation results show that such change can be attributed to the cavity resonance effect inside the slit arrays. The work is of great importance to the wavelength-selective devices design in optical devices and thermal application fields.
基金
Project(N110402015) supported by the Fundamental Research Funds for the Central Universities of China
Project(2012M510075) supported by China Postdoctoral Science Foundation
