摘要
文章以统计过程控制(SPC)中的均值—标准差(-R—R)控制图理论方法为基础,以宇航元器件关键工序中的集成电路键合拉力强度为研究对象,提出宇航元器件关键工序进行SPC的必要性,并提出以(-R—R)控制图作为质量工具对宇航元器件关键工艺进行质量监控的方法,计算出该关键工艺的过程能力指数。
Based on the average value-standard deviation（-R） control chart theory of the statistical process control（SPC）,the bond strength of the integrated circuit,as an important parameter in processing space-level components and parts,is investigated.The importance of the SPC in processing space-level components and parts is discussed,with the（-R） control chart as a tool for quality control.The process power index in the above key process is calculated.
出处
《航天器环境工程》
2012年第2期227-230,共4页
Spacecraft Environment Engineering
关键词
统计过程控制
元器件工艺
二方审查
数据监控
statistical process control
component processing
check from a second party
data monitoring
