期刊文献+

模拟电路符号法可测度分析的改进

Improvement of Analog Circuit Testability Analysis Based on Symbolic Method
下载PDF
导出
摘要 可测度是电路测试和故障诊断中一个重要概念,是测试节点选择的一个量化指标;使用符号分析的方法进行电路可测度计算;为了解决当诊断方程分母多项式的最高项系数不等于1时,符号法不能应用的问题,提出了一种原始诊断方程变换的新方法,利用符号法计算变换后诊断方程的可测度;电路实例分析表明,改进后的方法可以处理任意形式的电路诊断方程,计算中避免了误差的引入,具有计算简单、结果准确的特点。 Testability is an important concept in circuit test and fault diagnosis field, and it is a quantity measure of test node selection. Symbolic method is used to evaluate circuit testability. To resolve the problem that the symbolic method can't apply to the diagnosis equation whose coefficient of the item with highest power in the denominator is not equal to 1, a new method is proposed to transform the Original di- agnosis equation into a new one, which is then used to evaluate the circuit testability. The example circuit analysis shows that the improved method can do with any form fault diagnosis equation, it eliminates error introduction during calculation and has the feature of simple and ac curate.
出处 《计算机测量与控制》 CSCD 北大核心 2012年第9期2331-2334,共4页 Computer Measurement &Control
基金 国家自然科学基金资助(51005242)
关键词 可测度 故障诊断方程 模拟电路 符号法 雅可比矩阵 testability fault diagnosis equation, analog circuit~ symbolic method~ jacobian matrix
  • 相关文献

参考文献9

  • 1吴涛,叶晓慧,王红霞.基于量子遗传算法测试选择问题的研究[J].计算机测量与控制,2010,18(11):2508-2510. 被引量:15
  • 2Saeks R, Sen N, Chen H. M. S et al. Fault analysis in electronic circuits and systems[R]. Texas Technique University, Lubbock, Jan. 1978: 26-29.
  • 3Catelani M, Iuculano G. Liberatore A, et al. Improvements to nu merical testability evaluation [J]. IEEE Transactions on Instru mentation and Measurement, 1987, 36: 902- 907.
  • 4Manetti S. A new approach to automatic symbolic analysis of elec tric circuits [J]. Proceedings of Instrument. Electronic. Engineer Pt. G: Electronic Circuit System, 1991, 138: 22-28.
  • 5Giulio F, Antonio L, Stefano M, et al. A new symbolic method for analog circuit testability evaluation [J]. IEEE Transactions on In strumentation and Measurement, 1998, 47 (2): 554-565.
  • 6Cannas B, Fanni A, Montisci A. Testability evaluation for analog linear circuits via transfer function analysis [ A]. Proceeding of IEEE ISCAS [C]. Kobe, Japan, May 23 26, 2005:992-995.
  • 7Cannas B, Fanni A, Montisci A. Algebraic approach to ambiguity group determination in nonlinear analog circuits[J].IEEE Trans actions on Circuits and Systems-I, 2010,57 (2): 438 -447.
  • 8Liberatore A, Manetti S, Piccirilli M C, A new efficient method for analog circuit testability measurement [A]. Proceedings of IEEE Instrument and Measurement Technology Conference [ C ]. Hamamatsu, Japan, May 1994: 193-196.
  • 9Guo Z, Savir J. Analog circuit test using transfer function coeffi cient estimates[A]. Proceedings of International Test Conference [C]. Charlotte, NC, USA, 2003: 1155-1163.

二级参考文献3

共引文献14

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部