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基于ATML的测试程序自动生成系统软件体系结构 被引量:4

Software Architecture for Automatic Test Program Generation System Based on ATML
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摘要 针对目前ATS的测试程序主要依靠手工编写的现状,研究了基于ATML的测试程序自动生成系统的软件体系结构;通过对ATML框架结构的系统、深入分析,构建了基于ATML的测试程序自动生成系统的业务模型,以软件体系结构理论为基础,设计了基于ATML的测试程序自动生成系统的软件体系结构的"4+1"视图模型;该软件体系结构在通用机电测试平台的测试程序开发中得到了应用,结果表明,该模型可以为基于ATML的测试程序自动生成系统的开发提供顶层指导。 Targeted at the status of ATS's test program which is mainly hand-written at present, this paper researches the software ar- chitecture of automatic test program generation system based on ATML. Through deep and systematic analysis of ATML framework, the business model of automatic test program generation system is built. Based on the theory of software architecture, the "4+1" view model of software architecture of automatic test program generation system based on ATML is designed. This software architecture is used in test pro- gram development of general electromechanical test platform. The application result shows that the model can provide top-level guidance for development of automatic test program generation system based on ATML.
出处 《计算机测量与控制》 CSCD 北大核心 2012年第9期2571-2573,共3页 Computer Measurement &Control
关键词 ATS 测试程序 ATML 软件体系结构 ATS test program ATML software architecture
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  • 1罗锦,孟晨,杨锁昌.通用自动测试平台研究[J].中国测试技术,2005,31(5):9-12. 被引量:7
  • 2任献彬.ATS中的仪器可互换技术[J].宇航计测技术,2006,26(1):48-51. 被引量:13
  • 3IEEE 1641. IEEE Standard for Signal and Test Definition [S]. 2004.
  • 4孙鑫.XML、XMLSchemat、XSLT2.0和XQuery开发详解[M].北京:电子工业出版社,2009.
  • 5IEEE. IEEE Std 771 - 1998 IEEE guide to the use of the ATLAS specification[S]. US: IEEE, 1998:1 - 3.
  • 6Ashley M B Hulme. The ATLAS languagelpanacea or pariah? does it only specify the task or does it really drive the tester? [C]//IEEE. Proceedings of Autotestcon'95. US: IEEE, 1996:308-314.
  • 7Liguori F. The test langnge dilemma [ C ]// Proceedings of the 1971 annual conference. US, 1971 : 388 - 396.
  • 8Dr Ion A Neag. ATALS2K and the IVI signal interface--the framework for an open, modular and distributed ATS architecture [C]//IEEE. proceedings of autotestcon IEEE systems readiness technology conference. US: IEEE, 2001: 23-37.
  • 9SMITH J S, JOSHI S B. Reusable software concepts applied to the development of FMS control software [J]. J. Computer Integrated Manufacturing, 1992, 5 (3) : 182-196.
  • 10CLEAVELAND C J. Building application generators [J]. IEEE Software, 1996.

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  • 1IEEE Standards Coordination Committee 20. IEEE Standard for Automatic Test Markup Language (ATML) for exchanging auto- matic test equipment and test information via XML [S]. IEEE Standards Coordination Committee, USA, 2010.
  • 2王睿.基于ATML的自动测试系统软件研究[J].仪器仪表学报,2011,32(6):184-188.
  • 3IEEE Standards Coordination Committee 20. IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for ex- changing automatic test equipment and test information via XML: Exchanging Instrument Descriptions[S]. IEEE Standards Coordination Committee, USA, 2008.
  • 4IEEE Standards Coordination Committee 20. IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for ex- changing automatic test equipment and test information via XML: Exchanging Test Descriptions[S]. IEEE Standards Coor- dination Committee, USA, 2009.
  • 5IEEE Standard Coordinating Committee. IEEE Std 1641 - 2010 IEEE standard for signal and test definition IS]. USA: IEEE, 2010.
  • 6IEEE Standard Coordinating Committee. IEEE Std 1671 - 2010 IEEE standard for automatic test markup language (ATML) for ex- changing automatic test equipment and test information via XML IS]. USA IEEE, 2010.
  • 7IEEE Standard Coordinating Committee. IEEE Std 1671. 2 - 2012 IEEE Standard for automatic test markup language (ATML) instrument description Es. USA: IEEE, 2012.
  • 8Cornish M, Brown M. Implementing IEEE 1641-a demonstration of portability A. Autotestcon, 2005. IEEE C]. IEEE, 2005: 144 - 152.
  • 9Cornish M. Implementing IEEE 1641 -compilation techniques (to IVI driver code) EA. Autotesteon, 2009 IEEE EC]. IEEE, 2009: 317-321.
  • 10Niu S, Xu A, Song Z. A flexible software framework with dynamic expansible signals A. Autotestcon, 2014 IEEE EC. IEEE, 2014: 355-359.

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