摘要
准确测量LD/LED的P-I曲线,对于LD/LED的科学研究、生产制造及实际使用均具有很大意义。介绍了一种简易的LD/LED P-I曲线测试平台,该测试平台可间接连续地测出LD/LED的P-I曲线,并可以读出LD/LED在不同电流下的功率经光电转换后的电压值及LD的阈值电流。采用ICL8038芯片产生锯齿波,经V/I芯片AD694转换为0～20mA的锯齿波电流来驱动LD/LED。测试平台电路简单、易于实现、成本低,可操作性较强,可以很好地满足学生自己动手进行LD/LED特性参数相关实验的要求。结果表明,系统的可靠性较好。
It has great significance to accurately measure the P-I curve of LD/LED for its scientific research, production and practical use. The paper introduces a kind of simple and easy test platform for P-I curve of LD/LED. Using the platform,P-I curve of LD/LED can be measured indirectly and continuously,and the voltage of power by photoelectric conversion under different current of I.D/LED and threshold current of LD can be read. Sawtooth wave, which is produced by ICL8038 chip,is converted by AD694 which is a piece of V/I chip into sawtooth wave current ranged from 0 to 20 mA to drive LD/LED. For test platform, the circuit is simple; it is easy to be realized; cost is low; the maneuverability is strong. It can well meet the students＇ own hands on LD/LED characteristic parameters related experimental requirements. The results show that：the system reliability is better.
出处
《电子测量技术》
2012年第8期94-97,共4页
Electronic Measurement Technology
