1Masashi Shimanouchi " New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing," Proceedings of the International Test Conference 2002.
2Jose Moreira et al "PCB Loadboard Design Challenges for Multi-Gigabit Devices in Automated Test Applications," IEC DesignCon 2006.
3Jose Moreira et al "Beyound lOGb/s? Challenges of Characterizing Future I/O Interfaces with Automated Test Equipment," IEEE International Test Conference 2008.
4Lee W. Ritchey, "A Survey and Tutorial of Dielectric Materials used in the Manufacture of Printed Circuit Boards," Circuitree magazine, November 1999.
5H. A. Wheeler, "Transmission Line Properties of a Stripline between Parallel Planes," IEEE Trans. Microwave theory and Techniques, Vol. MTT-26, November, 1978, pp. 866-876.
