X射线对复合绝缘子内部缺陷的透照检测和诊断

Application of X-ray Technology in Composite Insulators Defect Diagnosis

复合绝缘子因其质轻耐污强度高和易维护,在中国已挂网运行近千万只,但是复合绝缘子因其特殊性,传统绝缘子的检测方法对其并不完全适用,复合绝缘子的发展亟待新型检测技术的出现。笔者运用X射线透视检测技术对复合绝缘子进行透照能力验证并得到推荐参数后,利用该参数对伞套区、芯棒区、伞套与芯棒胶结面、金具区段等4大区域的模拟缺陷进行检测,对成批的复合绝缘子进行现场检测,所获X射线成像图上复合绝缘子内部结构直观可见、缺陷类型及其位置清晰可辨、护套厚度芯棒直径等可测。研究结果可作为X射线透视检测技术对复合绝缘子进行缺陷检测以及型式检测的实践参考依据。

Because of its light weight,excellent pollution flashover performance,high mechanical strength and easy maintenance, composite insulators are widely used in our country about ten million. But for its particularity, the traditional insulator detection methods cannot be completely used in the composite insulator＇s detection, so it needs a new type composite insulator testing technology to promote the development of composite insulators. In this paper,we test the through ability of X-ray for composite insulator, and we get some parameters for the X-ray detection technology for composite insulator. Then we use the nondestructive testing technology of X-ray to detect lots of simulation defects in four areas of composite insulators （the umbrella skirt and sheath area,the mandrel area,the connection interface between the sheath and the mandrel,the metal parts area）,to detect some used composite insulators, with those parameters. From the many X-ray imaging drawing we get, it can be clearly see that the internal structure of composite insulators, that the defects type and their position, and it can be measured the sheath thickness and the mandrel diameter. The result can be used as a practical reference for the X-ray detection technology for composite insulators＇ defect detection and type detection.