摘要
以Lattice公司的ispLSI1032E为被测对象,设计出一套测试装置,对该芯片的性能指标和可能出现的故障进行测试。本装置只需配置三次电路和施加相应的测试向量就能对芯片进行全面的测试,提高了测试效率,实用价值很高。
The ispLSI1032E of Lattice Company is tested to design a set of testing equipment in this article, which can test ae performance index and possible fault of the chip. This equipment only need configurate three circuit and add corresponding test ector, which can take complete test for the chip and improve test efficiency. So it has good practical value.
出处
《电子技术应用》
北大核心
2012年第10期75-76,80,共3页
Application of Electronic Technique
