Ⅲ/Ⅴ族化合物半导体器件的空间应用可靠性

Reliability of Ⅲ/Ⅴ Semiconductor Devices in Space Applications

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摘要论述了Ⅲ/Ⅴ半导体器件在空间系统应用中的可靠性和质量鉴定方法。讨论了空间应用中该类器件常见的失效机制、辐射效应以及其它与高可靠性空间应用中相关的可靠性鉴定技术方法。 The reliability qualification issues related to III/V semiconductor devices in critical space systems are presented. The common failure mechanisms, radiation effects and the reliability qualification methods for devices in high reliability space applications are discussed.

作者张新焕刘军霞

机构地区中国电子科技集团公司第五十五研究所

出处《电子产品可靠性与环境试验》 2012年第5期46-50,共5页 Electronic Product Reliability and Environmental Testing

关键词失效机制质量鉴定辐射效应 failure mechanisms qualification radiation effects

分类号 TN303 [电子电信—物理电子学]

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Ⅲ/Ⅴ族化合物半导体器件的空间应用可靠性

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