利用原子力显微镜探测化学基团间的单键力

Investigations of Single-Bond Forces between Chemical Groups with Atomic Force Microscope

原子力显微镜(AFM)不仅可用于形貌测量,而且还可在纳米尺度上测量微观组分间的相互作用力。本文简要介绍了AFM的一种令人非常感兴趣的用途——测量和推算单个化学基团对之间的作用力(单键力)。单键力的测量和推算涉及AFM针尖的自组装单分子膜的化学修饰和Poisson统计方法的利用,文中概述了测量和推算的步骤和原理。AFM应用范围的拓宽必将促进它的进一步改进和发展。

Atomic force microscope (AFM) can be used for not only topographical measurements but also force measurements between molecules or chemical groups at nanometer scale. This paper introduced an interesting method to derive single-bond force between chemical groups from AFM force measurements. The previous wroks related to this method were also described. We outlined the derivation process which involved the chemical modification of AFM tips with self-assembled monolayer and the use of Poisson statistics.