BIT设计与发展综述

Study of built-in test

机内测试BIT(Built-In Test)是一种能显著提高系统测试性和诊断能力的重要技术,是实现可测试性设计的重要技术手段之一。介绍了机内测试技术的定义、特点、分类、设计内容以及设计流程等,详细阐述了机内测试技术的发展历程,并对测试性技术的新趋势进行了探讨和展望。

The built-in test （BIT） is an important technology that earl greatly improve the testability and diagnosis capability of the system, and it is one of the most important methods in testability design, this article introduces the definition, characteristic, classify, design contents and design flow of the BIT. Then, the achievements and development trends of BIT are reviewed in detail. Finally, the new trends of testability are discussed.