摘要
在大部分嵌入式系统中,内存的好坏主要依赖于内存芯片厂家的检测,对系统运行中出现的内存偶然故障,缺乏有效的检测手段。对嵌入式系统中内存检测的各个阶段、内存检测方式以及全空间检测方法等进行了详细描述。
In reason of oecurrent testing methods. memory embedded system, memory testing mainly relies on the manufacture. There is less methods to find the fauh. This paper proposes a whole procedure and methods of memory testing, and also the whole space
出处
《微型机与应用》
2012年第21期26-27,共2页
Microcomputer & Its Applications
