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Effect of indium addition on the microstructural formation and soldered interfaces of Sn-2.5Bi-1Zn-0.3Ag lead-free solder 被引量:3

Effect of indium addition on the microstructural formation and soldered interfaces of Sn-2.5Bi-1Zn-0.3Ag lead-free solder
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摘要 The microstructural formation and properties of Sn-2.5Bi-xln-lZn-0.3Ag (in wt%) alloys and the evolution of soldered interfaces on a Cu substrate were investigated. Apart from the relatively low melting point (about 195C), which is close to that of conventional eutectic Sn-Pb solder, the investigated solder presents superior wettability, solderability, and ductility. The refined equiaxial grains enhance the me- chanical properties, and the embedded bulk intermetallic compounds (IMCs) (Cu6Sn5 and CusZns) and granular Bi particles improve the joint reliability. The addition of In reduces the solubility of Zn in the 13-Sn matrix and strongly influences the separation and growth behaviors of the IMCs. The soldered interface of Sn-2.5Bi-xln-lZn-0.3Ag/Cu consists of Cu-Zn and Cu-Sn IMC layers. The microstructural formation and properties of Sn-2.5Bi-xln-lZn-0.3Ag (in wt%) alloys and the evolution of soldered interfaces on a Cu substrate were investigated. Apart from the relatively low melting point (about 195C), which is close to that of conventional eutectic Sn-Pb solder, the investigated solder presents superior wettability, solderability, and ductility. The refined equiaxial grains enhance the me- chanical properties, and the embedded bulk intermetallic compounds (IMCs) (Cu6Sn5 and CusZns) and granular Bi particles improve the joint reliability. The addition of In reduces the solubility of Zn in the 13-Sn matrix and strongly influences the separation and growth behaviors of the IMCs. The soldered interface of Sn-2.5Bi-xln-lZn-0.3Ag/Cu consists of Cu-Zn and Cu-Sn IMC layers.
出处 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2012年第11期1029-1035,共7页 矿物冶金与材料学报(英文版)
基金 the National Natural Science Foundation of China(No.51077099) Shang hai Baosteel Group Co.(No.50834011)
关键词 soldering alloys INDIUM microstrucmre INTERFACES melting point INTERMETALLICS soldering alloys indium microstrucmre interfaces melting point intermetallics
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  • 1J.ShenandY.C.Chan.Researchadvancesinnano—com—positesolders,Microelectron.Reliab.,49(2009),No.3,p.223.
  • 2N. Chawla, Thermomechanical behaviour of environmentally benign Pb-free solders, Int. Mater. Rev., 54(2009), No.6, p.368.
  • 3M. Abtew and G. Selvaduray, Lead-free solders in microe- lectronics, Mater. Sci. Eng. R, 27(2000), No.5, p.95.
  • 4X. Wang, Y. Xiu, and M.J. Dong, and Y.C. Liu, The micro- structure and properties of the Sn-xBi-0.9Zn-0.3Ag lead-free solders, J. Mater. Sci. Moter. Electron., 22(2011), No.6, p.592.
  • 5D.Q. Yu and L. Wang, The growth and roughness evolution of intermetallic compounds of Sn-Ag-Cu/Cu interface during soldering reaction, J. Alloys Compd., 458(2008), No.l, p.542.
  • 6G. Zeng, S.B. Xue, L.L. Zhang, L.L. Gao, W. Dai, and J.D. Luo, A review on the interfacial intermetallic compounds between Sn-Ag-Cu based solders and substrates, J. Mater. Sci Mater. Electron., 21(2010), No.5, p.421.
  • 7L. Zhang, S.B. Xue, L.L. Gao, G. Zeng, Z. Sheng, Y. Chen, and S.L. Yu, Determination of Anand parameters for SnAg-CuCe solder, Modell. Simul. Mater. Sci. Eng., 17(2009), No.7, art. no.075014.
  • 8C. Wei, Y.C. Liu, Z.M. Gao, C.S. Ma, and J.B. Wan, Effects of small addition of In on the structure of the rapidly cooled Sn-Ag-Zn solder, J. Alloys Compd” 470(2009), No. 1-2, p.145.
  • 9X. Wang, Y.C. Liu, C. Wei, L.M. Yu, Z.M. Gao, and Z.Z. Dong, Effects of composition and cooling rate on the microstructure of Sn-3.7Ag-0.9Zn-Bi solders, Appl. Phys. A, 96(2009), No.4, p.969.
  • 10X. Wang, Y.C. Liu, C. Wei, H.X. Gao, P. Jiang, and L.M. Yu, Strengthening mechanism of SiC-particulate reinforced Sn-3.7Ag-0.9Zn lead-free solder, J. Alloys Compd” 480(2009),No.2, p. 662.

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