摘要
通过分析SPARTAN-II FPGA器件的结构及其连线资源分布特点,寻找一种能够快速配置测试、具有高测试覆盖率的测试配置设计。所提出的把六倍资源连线分别配置成多条横向和纵向环形链路的测试配置设计,提高了测试覆盖率,尽可能地减少了测试配置文件数量。测试验证表明这样的连线资源测试配置设计方法,可直接应用到SPARTAN-II系列的所有型号FPGA的测试。通过更改测试模型数据,甚至可以应用于VIRTEX系列的FPGA测试。这种测试配置设计的特点是:测试效率高且具有高的测试覆盖率、测试结构清晰易于故障定位、延展性强可应用于其他型号的FPGA测试。
By analyzing the SPARTAN-II fied program mable gate arrags(FPGA) with device structure and the characteristics of routing resources distribution,a new testing configuration design was presented,which can set up testing environment quickly with high testing coverage.The new testing configuration design was connected all hex lines routing resources into several horizontal and vertical loop lines.It improves the test coverage and reduces the test configuration file numbers.The test results indicate that the new design can be used to test all FPGA of the SPARTAN-II series.The new design can be used to test VIRTEX series FPGA by changing the test module data.The new design features are high test efficiency,easy to locate the fault and strong scalability.
出处
《半导体技术》
CAS
CSCD
北大核心
2012年第11期900-904,共5页
Semiconductor Technology