用微波反射法测HgCdTe中少数载流子寿命

Measurement of Minority Carrier Lifetime in HgCdTe Using Microwave Reflectance Technique

介绍了用微波反射法测量HgCdTe中的少数载流子寿命 ,分析了其测量原理 ,并与接触式的光电导衰减法进行了对比。

A new method of microwave reflectance applied in measurement for the minority carrier lifetime in HgCdTe is introduced.The measuring mechanism is analyzed and comparison with the contact photoconduction decay measurement is carried out.