一种检测互连的I_(DDQ)内建并行测试方法

An I_(DDQ) based built in concurrent test technique for interconnects

并行测试是高可靠系统检测的一种有效方法 .分析了当前大多数并行测试所采用的技术 ,针对它们硬件代价高、不易现场检修、复杂性大的不足之处 ,提出了一种新的检测多芯片模块互连的并行内建自测试IDDQ方法 .该方法采用IDDQ监控器代替复杂的验证电路 ,可完全消除庞大的验证电路 ,提高系统的可靠性 .

Concurrent testing is an advanced testing technique. This paper analyses the techniques adopted by most concurrent tests. An I DDQ based scheme has been presented for the concurrent built in self test of MCM interconnects, in contrast to the disadvantages of the existing techniques, expensive hardware, difficult operation and unsuitability for field service. The main feature of the testing technique is the use of the I DDQ current sensor to completely eliminate the need for logic gates for verification purposes and improve the system reliability.